Single event effect calculation method taking into consideration real protection of integral circuits inside a satellite
Heading:
| 1Dotsenko, OV, 1Dmitrenko, VYa., 1Tarasov, VB, 1Shovkoplias, Yu.A 1Yangel Yuzhnoye State Design Office, Dnipropetrovsk, Ukraine |
| Kosm. nauka tehnol. 2007, 13 ;(3):019-026 |
| https://doi.org/10.15407/knit2007.03.019 |
| Publication Language: Russian |
Abstract: The method for single event effect rate calculation used in the practice of satellites hardness assurance to space environment is presented. We propose solutions allowing conduct single event effect rate calculation with consideration for real shielding distribution at the point of integral circuit placement inside a satellite. The results obtained through the method are compared with the ones calculated with the standard CREME-96 model.
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| Keywords: hardness assurance, method, space environment |
References:
1. Kuznetsov N. V., Nymmik R. A. Radiation Single Event Upsets in Spacecraft Microelectronics Caused by Solar Cosmic Ray Events. Kosmicheskie Issledovaniia, 35 (5), 465— 479 (1997) [in Russian].
2. Chumakov A. I. Effect of Cosmic Radiation on Integrated Circuits, 320 p. (Radio Svyaz', Moscow, 2004) [in Russian].
3. ECSS-E-10-04. Space Engineering. Space Environment, 196 p. (Noordwijk, The Netherlands, ECSS Secretariat, ESA- ESTEC, Requirements & Standards Division, 2000).
4. ESA/SCC basic specification N 25100. Single event test method and guidelines, 23 p. (European Space Agency, 1995).
5. Inguimbert C., Duzellier S. SEU rate calculation with GEANT4 (Comparison with CREME-86). IEEE Trans. Nucl. Sci., 51 (5), 2805—2810 (2004).
https://doi.org/10.1109/TNS.2004.836524
https://doi.org/10.1109/TNS.2004.836524
6. JESD89. Measurement and reporting of alpha particles and terrestrial cosmic ray-induced soft errors in semiconductor devices, 64 p. (JEDEC Solid State Technology Association, 2001).
7. Koons H. C., Mazur J. E., Selesnic R. S., et al. The impact of the space environment on space systems. Aerospace Report N TR-99(1670)-1, prepared by Space and Missile Systems Center, L. A., 202 p. (1999).
8. Tylka A. J., Adams J. H., Boberg P. R., et. al. CREME96: a revision of the cosmic ray effects on micro-electronics code. IEEE Trans. Nucl. Sci., 44 (6), 2150—2160 (1997).
https://doi.org/10.1109/23.659030